Product characteristics

Lightweight and convenient, easy to install, no need for air source, can be used by connecting to the power supply

Manual/automatic level adjustment, easy to operate

Real time detection of 6-degree-of-freedom vibration signals, actuator provides thrust, actively attenuates amplitude

Real time monitoring of tabletop vibration

Application

Atomic Force Microscope (AFM)
Scanning Probe Microscope (SPM)
3D Surface Measurement System
Tabletop SEM (Mini-SEM)
High-precision Optical Microscope
Nano Indentation System
Nano Measurement / Analysis Instruments

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Product characteristics

THA2 series active vibration isolator Developed for ultra precision equipment such as scanning electron microscopy, transmission electron microscopy, scanning tunneling microscopy, etc

Using high-end air suspension dampers for foundation isolation ensures continuous vibration stability even in the presence of irregular impact vibrations in the installation site environment

The self-developed THA active vibration reduction system achieves 6 degrees of freedom active vibration reduction. The combination of feedforward control technology and feedback control provides excellent isolation effect in the low frequency range

Optional electronic control automatic leveling system or mechanical leveling system, automatic leveling adjustment, one click start vibration reduction

Atomic Force Microscope (AFM)
Scanning Probe Microscope (SPM)
3D Surface Measurement System
Tabletop SEM (Mini-SEM)
High-precision Optical Microscope
Nano Indentation System
Nano Measurement / Analysis Instruments